🐸 BOGSWORTH NDT • MENTORSHIP LAB • SYNTHETIC DATA
PAUT Inspection Training Viewer
Linked A-scan, sectorial S-scan and encoded B-scan. Instructor validation pending.
Inspection controls
Scan coordinate—
Beam angle—
Highest gated echo—
Depth at gate peak—
A-scan — selected beam and encoder position
X-axis: depth (mm). Y-axis: synthetic relative amplitude (%). Linked to selected angle and scan position.S-scan — sectorial angular sweep
X-axis: refracted angle (°). Y-axis: true depth (mm). Educational angle-depth map, not geometrically rectified instrument pixels.B-scan — encoded longitudinal section
X-axis: encoded scan position (mm). Y-axis: true depth (mm). Maximum-amplitude projection across simulated beam angles.Interpretation and instructor notes
Use the encoder and beam sliders, or tap on a B-scan or S-scan image to reposition the linked cursors.
| Sample | Scan (mm) | Depth (mm) | Peak angle |
|---|
Synthetic reflectors are independent Gaussian echoes. No acoustic wave propagation or focal laws are simulated.